Probing Carrier Depletions on Grain Boundaries in Polycrystalline Si Thin Films by Scanning Capacitance Microscopy
- 著者名:
C.-S. Jiang H.R. Moutinho B. To P. Dippo M.J. Romero M.M. Al-Jassim - 掲載資料名:
- Amorphous and polycrystalline thin-film silicon science and technology--2008 : symposium held March 25-28, 2008, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 1066
- 発行年:
- 2008
- 開始ページ:
- 87
- 終了ページ:
- 92
- 総ページ数:
- 6
- 出版情報:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605110363 [1605110361]
- 言語:
- 英語
- 請求記号:
- M23500/1066
- 資料種別:
- 国際会議録
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