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Characterization of amorphous/crystalline silicon interfaces from electrical measurements

著者名:
掲載資料名:
Amorphous and polycrystalline thin-film silicon science and technology--2008 : symposium held March 25-28, 2008, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
1066
発行年:
2008
開始ページ:
75
終了ページ:
86
総ページ数:
12
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781605110363 [1605110361]
言語:
英語
請求記号:
M23500/1066
資料種別:
国際会議録

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