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Predicting Product Cosmetic Quality Using Virtual Environments

著者名:
John Maxfield
Neal P. Juster
Peter M. Dew
Stephen Taylor
Martin Fitchie
William J. Ion
Jeff Zhao
Martin Thompson
さらに 3 件
掲載資料名:
20th Computers and Information in Engineering Conference
シリーズ名:
ASME Symposia Volumes
シリーズ巻号:
DETC 2000(1)
発行年:
2000
巻:
1
ペーパー番号:
DETC2000/CIE-14591
開始ページ:
747
終了ページ:
756
総ページ数:
10
出版情報:
New York, N.Y.: American Society of Mechanical Engineers
ISBN:
9780791835111 [0791835111]
言語:
英語
請求記号:
A11633/2000
資料種別:
国際会議録

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