Predicting Product Cosmetic Quality Using Virtual Environments
- 著者名:
John Maxfield Neal P. Juster Peter M. Dew Stephen Taylor Martin Fitchie William J. Ion Jeff Zhao Martin Thompson - 掲載資料名:
- 20th Computers and Information in Engineering Conference
- シリーズ名:
- ASME Symposia Volumes
- シリーズ巻号:
- DETC 2000(1)
- 発行年:
- 2000
- 巻:
- 1
- ペーパー番号:
- DETC2000/CIE-14591
- 開始ページ:
- 747
- 終了ページ:
- 756
- 総ページ数:
- 10
- 出版情報:
- New York, N.Y.: American Society of Mechanical Engineers
- ISBN:
- 9780791835111 [0791835111]
- 言語:
- 英語
- 請求記号:
- A11633/2000
- 資料種別:
- 国際会議録
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