Estimation of Power Density in VLSI Circuits Using Monte Carlo Simulation

Estimation of Power Density in VLSI Circuits Using Monte Carlo Simulation

著者名:

掲載資料名:

13th Biennial Conference on Reliability, Stress Analysis, and Failure Prevention

シリーズ名:

ASME Symposia Volumes

シリーズ巻号:

DETC 1999(5)

発行年:

1999

巻:

5

ペーパー番号:

DETC99/RSAFP-8847

開始ページ:

11

終了ページ:

16

総ページ数:

6

出版情報:

New York, N.Y.: American Society of Mechanical Engineers

ISBN:

9780791819753 [0791819752]

言語:

英語

請求記号:

A11633/1999

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00048550
シリーズID:	PA00000270
会議名:	Biennial Conference on Reliability, Stress Analysis, and Failure Prevention ; Asme Design Engineering Technical Conferences
回次:	13th ; 1999
会議開催地:	Las Vegas, Nevada, USA
会議開催年:	1999.09.12-1999.09.16

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