Implant Metrology for Bonded SOI Wafers using a Surface Photo-Voltage Technique
- 著者名:
A. F. Bertuch W. Smith K. Steeples R. Standley A. Stefanescu R. Johnson - 掲載資料名:
- Silicon-on-insulator technology and devices 13
- シリーズ名:
- ECS transactions
- シリーズ巻号:
- 6(4)
- 発行年:
- 2007
- 開始ページ:
- 179
- 終了ページ:
- 184
- 総ページ数:
- 6
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 19385862
- ISBN:
- 9781566775533 [1566775531]
- 言語:
- 英語
- 請求記号:
- E23400/6-4
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
3
国際会議録
Development of 3C-SiC SOI Structures using Si on Polycrystalline SiC Wafer Bonded Substrates
Trans Tech Publications |
Society of Manufacturing Engineers |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
Electrochemical Society |
Society of Photo-optical Instrumentation Engineers |
Electrochemical Society |
Materials Research Society |