Origin of Transient Gate Current Observed in Pseudo-MOS Transistor
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国際会議録
Impact of the Schottky contacts on characterization of ultra-thin SOI pseudo-MOS transistors
Electrochemical Society |
Trans Tech Publications |
Trans Tech Publications | |
Electrochemical Society |
Kluwer Academic Publishers |
Electrochemical Society |
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Electrochemical Society |
Trans Tech Publications |