Blank Cover Image

Influence of Oxide Breakdown Percolation Resistance on MOSFETS

著者名:
掲載資料名:
Silicon nitride, silicon dioxide, and emerging dielectrics 9
シリーズ名:
ECS transactions
シリーズ巻号:
6(3)
発行年:
2007
開始ページ:
431
終了ページ:
448
総ページ数:
18
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566775526 [1566775523]
言語:
英語
請求記号:
E23400/6-3
資料種別:
国際会議録

類似資料:

Kondekar, Pravin N., Patil, Mahesh B., Parikh, Chetan D.

SPIE-The International Society for Optical Engineering

Suzuki, S., Cho, W.J., Kosugi, R., Senzaki, J., Harada, S., Fukuda, K.

Trans Tech Publications

Lim,E.H., Siah,S.-Y., Lim,C.W., Lee,Y.M., Zheng,J.Z., Sundaresan,R., Pey,K.L.

SPIE - The International Society for Optical Engineering

J. Sune, E. Wu, S. Tous

Electrochemical Society

Weir, B. E., Silverman, P. J., Alers, G. B., Monroe, D., Alam, M. A., Sorsch, T. W., Green, M. L., Timp, G. L., Ma, Y., …

MRS - Materials Research Society

Lun, Z., Ang, D.S., Ling, C.H.

Electrochemical Society

Lim,C.W,, Lahiri,S.K., Tung,C.H., Wong,S.M., Lee,K.H., Wong,H., Pey,K.L., Chan,L.H.

SPIE-The International Society for Optical Engineering

Ho, C. S., Pey, K. L., Tung, C. H., Tee, K. C., Prasad, K., Saigal, D., Tan, J. J. L., Wong, H., Lee, K. H., Osipowicz, …

MRS - Materials Research Society

Kumar, A., Khanna, V.K., Sood, S.C., Gupta, R.P.

SPIE-The International Society for Optical Engineering

Gila, B.P., Johnson, J.W., Lee, K.N., Krishnamoorthy, V., Abernathy, C.R., Ren, F., Pearton, S.J.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12