Oxide Dielectrics for Reliable Passivation of AlGaN/GaN HEMTs and Insulated Gates
- 著者名:
B. Gila M. Hlad T. Anderson J. Chen K. Allums A. Gerger A. Herrero S. Jang B. Kang C. R. Abernathy F. Ren S. J. Pearton - 掲載資料名:
- State-of-the-art program on compound semiconductors 45 (SOTAPOCS 45) and wide bandgap semiconductor materials and devices 7
- シリーズ名:
- ECS transactions
- シリーズ巻号:
- 3(5)
- 発行年:
- 2006
- 開始ページ:
- 141
- 終了ページ:
- 150
- 総ページ数:
- 10
- 出版情報:
- Pennington, N.J: Electrochemical Society
- ISSN:
- 19385862
- ISBN:
- 9781566775052 [1566775051]
- 言語:
- 英語
- 請求記号:
- E23400/3-5
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Novel Oxides and Reliability for the Passivation of AlGaN/GaN High Electron Mobility Transistor
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