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On the Effects of Carrier Tunneling on the Capacitance-Voltage Characteristics of Ultrathia-Oxide MOSFETs

著者名:
掲載資料名:
Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5
シリーズ名:
ECS transactions
シリーズ巻号:
1(1)
発行年:
2005
開始ページ:
283
終了ページ:
294
総ページ数:
12
出版情報:
Pennington, N.J.: Electrochemical Society
ISSN:
19385862
ISBN:
9781566774307 [1566774306]
言語:
英語
請求記号:
E23400/1-1
資料種別:
国際会議録

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