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Spectroscopic Ellipsometry Studies of Tb-Doped SiO₂ Thin Films

著者名:
掲載資料名:
Materials and processes for nonvolatile memories II : symposium held April 10-13, 2007, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
997
発行年:
2007
巻:
997
開始ページ:
363
終了ページ:
368
総ページ数:
6
出版情報:
Warrendale, Pa.: Materiaeditors, Tingkai Li ... [et al.] ls Research Society
ISSN:
02729172
ISBN:
9781558999572 [1558999574]
言語:
英語
請求記号:
M23500/997
資料種別:
国際会議録

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