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Aspects of a novel method for the pore size analysis of thin silica films based on krypton adsorption at liquid argon temperature (87.3 k)

著者名:
掲載資料名:
Recent progress in mesostructured materials : proceedings of the 5th International Mesostructured Materials Symposium (IMMS2006), Shanghai, P.R. China, August 5-7, 2006
シリーズ名:
Studies in surface science and catalysis
シリーズ巻号:
165
発行年:
2007
開始ページ:
551
終了ページ:
554
総ページ数:
4
出版情報:
Amsterdam: Elsevier
ISSN:
01672991
ISBN:
9780444521781 [044452178X]
言語:
英語
請求記号:
S76950
資料種別:
国際会議録

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