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Accuracy analysis and error correction of MODIS surface reflectance products

著者名:
X. Liu ( Shanghai Univ. (China) and Yangtze Univ. (China) )
X. Li ( Shanghai Univ. (China) )
J. Mao ( Shanghai Univ. (China) )
Q. Zeng ( Shanghai Univ. (China) )
Q. Chen ( Shanghai Univ. of Engineering Science (China) )
C. Guan ( Shanghai Univ. (China) )
さらに 1 件
掲載資料名:
Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6752
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819469120 [0819469122]
言語:
英語
請求記号:
P63600/6752
資料種別:
国際会議録

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