High resolution interferometric metrology for patterned wafers
- 著者名:
- S. Tang ( KLA-Tencor (USA) )
- K. Freischlad ( KLA-Tencor (USA) )
- P. Yam ( KLA-Tencor (USA) )
- 掲載資料名:
- Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6672
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819468208 [0819468207]
- 言語:
- 英語
- 請求記号:
- P63600/6672
- 資料種別:
- 国際会議録
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