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Weighted least-square approach for simultaneous measurement of multiple reflective surfaces

著者名:
掲載資料名:
Optical manufacturing and testing VII : 28-29 August 2007, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6671
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819468192 [0819468193]
言語:
英語
請求記号:
P63600/6671
資料種別:
国際会議録

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