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Near-field birefringence response in thickness direction of liquid crystal thin film

著者名:
  • J. Qin ( Tokyo Univ. of Agriculture and Technology (Japan) )
  • N. Umeda ( Tokyo Univ. of Agriculture and Technology (Japan) )
掲載資料名:
Instrumentation, metrology, and standards for nanomanufacturing : 29-30 August 2007, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6648
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467966 [0819467960]
言語:
英語
請求記号:
P63600/6648
資料種別:
国際会議録

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