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Fault tolerant techniques for integrated circuits in submicron and nanotechnologies

著者名:
A. Bacivarov ( EUROQUALROM, Univ. Politehnica Bucharest (Romania) )  
掲載資料名:
Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6635
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819467799 [0819467790]
言語:
英語
請求記号:
P63600/6635
資料種別:
国際会議録

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