Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs
- 著者名:
- C.-H. Chen ( McMaster Univ. (Canada) )
- Z. Zeng ( United Microelectronics Corp. Group (USA) )
- J.-S. Jan ( United Microelectronics Corp. Group (USA) )
- K.-C. Wang ( United Microelectronics Corp. Group (USA) )
- C.-s Yeh ( United Microelectronics Corp. (Taiwan) )
- 掲載資料名:
- Noise and fluctuations in circuits, devices, and materials : 21-24 May 2007, Florence, Italy
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6600
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819467379 [0819467375]
- 言語:
- 英語
- 請求記号:
- P63600/6600
- 資料種別:
- 国際会議録
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