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Application of particle analysis to transmission electron microscopy (TEM)

著者名:
J. DaPonte ( Southern Connecticut State Univ. (USA) )
T. Sadowski ( Southern Connecticut State Univ. (USA) )
C. C. Broadbridge ( Southern Connecticut State Univ. (USA) )
D. Day ( Southern Connecticut State Univ. (USA) )
A. H. Lehman ( Southern Connecticut State Univ. (USA) )
D. Krishna ( Southern Connecticut State Univ. (USA) )
L. Marinella ( Southern Connecticut State Univ. (USA) )
P. Munhutu ( Southern Connecticut State Univ. (USA) )
M. Sawicki ( Southern Connecticut State Univ. (USA) )
さらに 4 件
掲載資料名:
Visual information processing XVI : 10 April 2007, Orlando, Forida [i.e. Florida], USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6575
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819466976 [0819466972]
言語:
英語
請求記号:
P63600/6575
資料種別:
国際会議録

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