Nondestructive testing of ferroelectrics by thermal wave methods

Nondestructive testing of ferroelectrics by thermal wave methods

著者名:

G. Gerlach ( Technische Univ. Dresden (Germany) )
G. Suchaneck ( Technische Univ. Dresden (Germany) )
A. Movchikova ( Tver State Univ. (Russia) )
O. Malyshkina ( Tver State Univ. (Russia) )

掲載資料名:

Sensor systems and networks : phenomena, technology, and applications for NDE and health monitoring 2007 : 19-21 March 2007, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6530

発行年:

2007

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819466518 [0819466514]

言語:

英語

請求記号:

P63600/6530

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046837
シリーズID:	PA00000029
会議名:	Smart Structures : Sensor systems and networks
回次:	2007
会議開催地:	San Diego, CA, USA
会議開催年:	2007.03.19-2007.03.21

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4 国際会議録 Temperature-dependent spectral ellipsometry: a powerful technique for thin film investigations Deineka, A., Pokorny, P., Jastrabik, L., Suchaneck, G., Gerlach, G. SPIE-The International Society for Optical Engineering	10 国際会議録 Thermal wave methods for nondestructive inspection and process control L.M. Flath, S.M. Shepard Society of Photo-optical Instrumentation Engineers
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