A system-on-board approach for impedance-based structural health monitoring
- 著者名:
- J. Kim ( Virginia Tech (USA) )
- B. L. Grisso ( Virginia Tech (USA) )
- D. S. Ha ( Virginia Tech (USA) )
- D. J. Inman ( Virginia Tech (USA) )
- 掲載資料名:
- Sensors and smart structures, technologies for civil, mechanical, and aerospace systems
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6529
- 発行年:
- 2007
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819466501 [0819466506]
- 言語:
- 英語
- 請求記号:
- P63600/6529
- 資料種別:
- 国際会議録
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