Toward a compact dual-wedge point-scanning confocal reflectance microscope

Toward a compact dual-wedge point-scanning confocal reflectance microscope

著者名:

W. C. Warger II ( Northeastern Univ. (USA) )
S. A. Guerrera ( Northeastern Univ. (USA) )
C. A. DiMarzio ( Northeastern Univ. (USA) )

掲載資料名:

Three-dimensional and multidimensional microscopy : image acquisition and processing XIV : 23-25 January 2007, San Jose, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6443

発行年:

2007

ペーパー番号:

644311

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819465566 [0819465569]

言語:

英語

請求記号:

P63600/6443

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046751
シリーズID:	PA00000029
会議名:	SPIE BiOS : Three-Dimensional and Multidimensional Microscopy
回次:	2007 : 14th
会議開催地:	San Jose, CA, USA
会議開催年:	2007.01.23-2007.01.25
論文注記:	644311 ; 14th Symposium on image acquisition and processing, 23-25 January 2007, San Jose, California, USA

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