Averaging algorithm of reticle images in low-level-light weapon sight based on impact condition

著者名:

Y. Gao ( Nanjing Univ. of Science and Technology (China) and Nanyang Institute of Technology (China) )

B. Chang ( Nanjing Univ. of Science and Technology (China) )

S. Tian ( Nanjing Univ. of Science and Technology (China) and Nanyang Institute of Technology (China) )

Y. Qiu ( Nanjing Univ. of Science and Technology (China) )

J. Qiao ( Nanjing Univ. of Science and Technology (China) and Nanyang Institute of Technology (China) )

R. Fu ( Nanjing Univ. of Science and Technology (China) )

さらに 1 件

掲載資料名:

27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6279

発行年:

2007

パート:

2

ペーパー番号:

62792U

開始ページ:

62792U-1

終了ページ:

62792U-7

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463494 [0819463493]

言語:

英語

請求記号:

P63600/6279

資料種別:

国際会議録