A robustness-enhancing method for real-time surface defection inspection

A robustness-enhancing method for real-time surface defection inspection

著者名:

Z. Dong ( Shanghai Univ. (China) )
Z. Zhang ( Shanghai Univ. (China) )
H. Ma ( Shanghai Univ. (China) )

掲載資料名:

27th International Congress on High-Speed Photography and Photonics : 17-22 September 2006, Alexandria, Xian, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6279

発行年:

2007

パート:

1

ペーパー番号:

62790N

開始ページ:

62790N-1

終了ページ:

62790N-6

総ページ数:

6

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463494 [0819463493]

言語:

英語

請求記号:

P63600/6279

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046709
シリーズID:	PA00000029
会議名:	International Congress on High-Speed Photography and Photonics
回次:	2006 : 27th
会議開催地:	Alexandria, Xian, China
会議開催年:	2006.09.17-2006.09.22
論文注記:	62790N ; 27th International Congress on High-Speed Photography and Photonics, 17-22 September 2006, Xi'an, China

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