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Layout verification and optimization based on flexible design rules [6156-09]

著者名:
  • Yang, J. ( Advanced Micro Devices, Inc (USA) and Univ. of Michigan, Ann Arbor (USA) )
  • Capodieci, L. ( Advanced Micro Devices, Inc (USA) )
  • Sylvester, D. ( Univ. of Michigan, Ann Arbor (USA) )
掲載資料名:
Design and process integration for microelectronic manufacturing IV : 23-24 February, 2006, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6156
発行年:
2006
開始ページ:
61560A
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461995 [0819461997]
言語:
英語
請求記号:
P63600/6156
資料種別:
国際会議録

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