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Modelling of MSM photodeters using RF measurement technique [6352-139]

著者名:
  • Cha, C. ( Korea Electronics Technology Institute (South Korea) )
  • Huang, Z. ( Rensselaer Polytechnic Institute (USA) )
掲載資料名:
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6352
発行年:
2006
パート:
2
開始ページ:
63523M
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819464477 [0819464473]
言語:
英語
請求記号:
P63600/6352
資料種別:
国際会議録

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