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Semiconductor polycrystalline alpha detectors [6319A-36]

著者名:
Schieber, M.
Roth, M.
Zuck, A.
Marom, G.
Khakhan, O. ( The Hebrew Univ. of Jerusalem (Israel) )
Alfassi, Z. B. ( Ben-Gurion Univ. of the Negev (Israel) )
さらに 1 件
掲載資料名:
Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6319
発行年:
2006
開始ページ:
631914
終了ページ:
631914
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463982 [0819463981]
言語:
英語
請求記号:
P63600/6319
資料種別:
国際会議録

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