Semiconductor polycrystalline alpha detectors [6319A-36]
- 著者名:
Schieber, M. Roth, M. Zuck, A. Marom, G. Khakhan, O. ( The Hebrew Univ. of Jerusalem (Israel) ) Alfassi, Z. B. ( Ben-Gurion Univ. of the Negev (Israel) ) - 掲載資料名:
- Hard X-ray and gamma-ray detector physics and Penetrating radiation systems VIII : 14-17 August 2006, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6319
- 発行年:
- 2006
- 開始ページ:
- 631914
- 終了ページ:
- 631914
- 総ページ数:
- 1
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463982 [0819463981]
- 言語:
- 英語
- 請求記号:
- P63600/6319
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society | |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |