Localizing source distribution based on the adaptive finite element methods for bioluminescence tomography [6318-59]

Localizing source distribution based on the adaptive finite element methods for bioluminescence tomography [6318-59]

著者名:

Lv, Y.

Tian, J.

Luo, J. ( Institute of Automation (China) )

Li, H. ( Institute of Automation (China) and Capital Normal Univ. (China) )

Cong, W.

Wang, G. ( Univ. of Iowa (USA) )

Yang, W. ( Institute of Automation (China) )

さらに 2 件

掲載資料名:

Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6318

発行年:

2006

開始ページ:

63181L

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819463975 [0819463973]

言語:

英語

請求記号:

P63600/6318

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016324
シリーズID:	PA00000029
会議名:	Optics & Photonics : Developments in X-ray tomography
回次:	2006 : 5th
会議開催地:	San Diego, CA, USA
会議開催年:	2006.08.15-2008.08.17

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