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New developments for synchrotron-radiation-based microtomography at DESY (Invited Paper) [6318-37]

著者名:
Beckmann, F.
Donath, T. ( GKSS-Research Ctr., Geesthacht (Germany) )
Fischer, J. ( Hannover Medical School (Germany) )
Dose, T.
Lippmann, T.
Lottermoser, L.
Martins, R. V.
Schreyer, A. ( GKSS-Research Ctr., Geesthacht (Germany) )
さらに 3 件
掲載資料名:
Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6318
発行年:
2006
開始ページ:
631810
終了ページ:
631810
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819463975 [0819463973]
言語:
英語
請求記号:
P63600/6318
資料種別:
国際会議録

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