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Direct wavefront phase measurement using a point diffraction interferometer with application to large scale AO [6306-20]

著者名:
掲載資料名:
Advanced wavefront control : methods, devices and applications IV : 14-15 August 2006, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6306
発行年:
2006
開始ページ:
63060I
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463852 [081946385X]
言語:
英語
請求記号:
P63600/6306
資料種別:
国際会議録

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