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Numerical study on cold transfer characteristics of the space in a semiconductor refrigeration device [6280-143]

著者名:
  • Zhang H.
  • Wang J. ( Hefei Univ. of Technology (China) )
  • Fan K.-C. ( Hefei Univ. of Technology (China) and National Taiwan Univ. (Taiwan, China) )
掲載資料名:
Third International Symposium on Precision Mechanical Measurements
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6280
発行年:
2006
パート:
2
開始ページ:
62803Y
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463517 [0819463515]
言語:
英語
請求記号:
P63600/6280
資料種別:
国際会議録

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