Advancements in DEPMOSFET device developments for XEUS [6276-17]

Advancements in DEPMOSFET device developments for XEUS [6276-17]

著者名:

Treis, J. ( Max-Planck-Institut fur extraterrestrische Physik (Germany) and MPI Haibleiterlabor (Germany) )

Bombelli, J. ( Politecnico di Milano (Italy) )

Eckart, R. ( PNSensor GmbH (Germany) and MPI Haibleiterlabor (Germany) )

Fiorini, C. ( Politecnico di Milano (Italy) )

Fischer, P. ( Univ. Mannheim (Germany) )

Halker, O.

Herrmann, S. ( Max-Planck-Institut fur extraterrestrische Physik (Germany) and MPI Halbleiterlabor (Germany) )

Lechner, P. ( PNSensor GmbH (Germany) and MPI Halbleiterlabor (Germany) )

Lutz, G. ( Max-Planck-lnstitut fur Physik (Germany) and MPI Halbleiterlabor (Germany) )

Peric, I. ( Univ. Mannheim (Germany) )

Porro, M. ( Max-Planck-Institut fur extraterrestrische Physik (Germany) and MPI Halbleiterlabor (Germany) )

Richter, R. H. ( Max-Planck-lnstitut fur Physik (Germany) and MPI Haibleiterlabor (Germany) )

Schaller, G.

Schooper, F. ( Max-Planck-lnstitut fur extraterrestrische Physik (Germany) and MPI Halbleiterlabor (Germany) )

Soltau, H. ( PNSensor GmbH (Germany) and MPI Halbleiterlabor (Germany) )

さらに 10 件

掲載資料名:

High energy, optical, and infrared detectors for astronomy II : 24-27 May, 2006, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6276

発行年:

2006

開始ページ:

627610

終了ページ:

627611

総ページ数:

2

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463418 [0819463418]

言語:

英語

請求記号:

P63600/6276

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016284
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : High energy, optical, and infrared detectors for astronomy
回次:	2006 : 2nd
会議開催地:	Orlando, FL, USA
会議開催年:	2006.05.24-2006.05.27

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1 国際会議録 Noise and spectroscopic performance of DEPMOSFET matrix devices for XEUS [5898-34] Treis, J., Fischer, P., Halker, O., Herrmann, S., Kohrs, R., Kruger, H., Lechner, P., Lutz, G., Peric, I., Porro, M., … SPIE - The International Society of Optical Engineering	7 国際会議録 Active pixel sensors for imaging x-ray spectrometers Holl, P., Fischer, P., Hartmann, R., Hasinger, G., Kollmer, J., Krause, N., Lechner, P., Lutz, G., Meidinger, N., Peric, … SPIE-The International Society for Optical Engineering
2 国際会議録 First results of DEPFET-based active-pixel-sensor prototypes for the XEUS wide-field imager Treis, J., Fischer, P., Halker, O., Harter, M., Herrmann, S., Kohrs, R., Kruger, H., Lechner, P., Lutz, G., Peric, I., … SPIE - The International Society of Optical Engineering	8 国際会議録 Systematic testing and results of x-ray CCDs developed for eROSITA and other applications [6276-46] Meidinger, N., Andritschke, R., Halker, O., Hartmann, R., Hartner, G., Hasinger, G., Herrmann, S., Holl, P., Hyde, E., … SPIE - The International Society of Optical Engineering
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