Noise and zero point drift in 1.7μm cutoff detectors for SNAP [6276-30]
- 著者名:
Smith, R. ( California Institute of Technology (USA) ) Bebek, C. ( Lawrence Berkeley National Lab. (USA) ) Bonati, M. ( California Institute of Technology (USA) ) Brown, M. G. ( Univ. of Michigan (USA) ) Cole, D. ( Jet Propulsion Lab. (USA) ) Rahmer, G. ( California Institute of Technology (USA) ) Schubnell, M. ( Univ. of Michigan (USA) ) Seshadri, S. ( Jet Propulsion Lab. (USA) ) Tarle, G. ( Univ. of Michigan (USA) ) - 掲載資料名:
- High energy, optical, and infrared detectors for astronomy II : 24-27 May, 2006, Orlando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6276
- 発行年:
- 2006
- 開始ページ:
- 62760R
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819463418 [0819463418]
- 言語:
- 英語
- 請求記号:
- P63600/6276
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
4
国際会議録
Count rate dependent non-linearity and pixel size variations in 1.7 micron cut-off detectors
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |