Low-noise low-power readout electronics circuit development in standard CMOS technology for 4 K applications [6275-43]

Low-noise low-power readout electronics circuit development in standard CMOS technology for 4 K applications [6275-43]

著者名:

Merken P. ( IMEC (Belgium), RMA (Belgium) )
Souverijns T.
Putzeys J.
Creten Y.
Van Hoof C. ( IMEC (Belgium) )

掲載資料名:

Millimeter and submillimeter detectors and instrumentation for astronomy III : 29-31 May, 2006, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6275

発行年:

2006

開始ページ:

627516

終了ページ:

627516

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463401 [081946340X]

言語:

英語

請求記号:

P63600/6275

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016283
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : Millimeter and submillimeter detectors and instrumentation for astronomy
回次:	2006 : 3rd
会議開催地:	Orlando, FL, USA
会議開催年:	2006.05.29-2006.05.31

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