Blank Cover Image

Pipeline reductions of VLTI/MIDI data and quality control [6268-143]

著者名:
掲載資料名:
Advances in Stellar Interferometry
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6268
発行年:
2006
パート:
2
開始ページ:
62683X
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463333 [0819463337]
言語:
英語
請求記号:
P63600/6268
資料種別:
国際会議録

類似資料:

Morel, S., Ballester, P., Bauvir, B., Biereichel, P., Cuby, J. -G., Galliano, E., Haddad, N., Housen, N., Hummel, Ch. …

SPIE - The International Society of Optical Engineering

Percheron, I., Moehler, S.

SPIE - The International Society of Optical Engineering

C. A. Hummel

Society of Photo-optical Instrumentation Engineers

Lopez,B., Leinert,C., Graser,U., Waters,L.B.F.M., Perrin,G., Herbst,T.M., Rottgering,H.J.A., Rouan,D., Stecklum,B., …

SPIE - The International Society for Optical Engineering

Percheron, I., Ballester, P., Sabet, C., Wittkowski, M., Morel, S., Richichi, A.

SPIE - The International Society of Optical Engineering

I. Percheron

ESA Publications Division

Percheron, I., Wittkowski, M., Donaldson, R., Fedrigo, E., Lidman, C., Morel, S., Rantakyro, F., Schoeller, M., …

SPIE - The International Society of Optical Engineering

Dobrzycka, D., Hummel, W., Lidman, C., Ageorges, N., Marco, O., Jung, Y.

SPIE - The International Society of Optical Engineering

I. Percheron

Society of Photo-optical Instrumentation Engineers

Hummel, W., Lidman, C., Devillard, N., Jung, Y., Johnson, R., Doublier, V.

SPIE-The International Society for Optical Engineering

van Boekel, R., Abraham, P., Correia, S., de Koter, A., Dominik, C., Dutrey, A., Henning, T., Kospal, A., Lachaume, R., …

SPIE - The International Society of Optical Engineering

Lopez, B., Przygodda, F., Wolf, S., Dugue, M., Graser, U., Gitton, Ph., Mathias, Ph., Antonelli, P., Avgereau, J. -C., …

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12