Blank Cover Image

Reliability and field testing of distributed strain and temperature sensors (Invited Paper) [6167-48]

著者名:
掲載資料名:
Smart structures and materials 2006 : Smart sensor monitoring systems and applications : 27 February-1 March 2006, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6167
発行年:
2006
開始ページ:
61671D
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462206 [0819462209]
言語:
英語
請求記号:
P63600/6167
資料種別:
国際会議録

類似資料:

Inaudi, D., Glisic, B.

SPIE - The International Society of Optical Engineering

Inaudi, D., Glisic, B., Vurpillot, S.

SPIE - The International Society of Optical Engineering

Inaudi, D., Glisic, B.

SPIE - The International Society of Optical Engineering

Inaudi, D., Glisic, B.

SPIE-The International Society for Optical Engineering

Inaudi, D.

SPIE - The International Society of Optical Engineering

Inaudi, D.

SPIE-The International Society for Optical Engineering

B. Glisic, D. Posenato, D. Inaudi

SPIE - The International Society of Optical Engineering

Thursby, G., Dong, F., Culshaw, B., Massaro, G., Glisic, B., Inaudi, D.

SPIE - The International Society of Optical Engineering

Glisic, B., Inaudi, D.

SPIE - The International Society of Optical Engineering

E. Pinet, C. Hamel, B. Glisic, D. Inaudi, N. Miron

SPIE - The International Society of Optical Engineering

Glisic, B., Inaudi, D.

SPIE-The International Society for Optical Engineering

Glisic,B., Inaudi,D., Kronenberg,P., LLoret,S., Vurpillot,S.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12