In-line TEM sample preparation and wafer return strategy for rapid yield learning [6152-81]

In-line TEM sample preparation and wafer return strategy for rapid yield learning [6152-81]

著者名:

Bicais-Lepinay, N. ( STMicroelectronics (France) )

Andre, F. ( STMicroelectronics (France) )

Brevers, S. ( STMicroelectronics (France) )

Guyader, P. ( STMicroelectronics (France) )

Trouiller, C. ( STMicroelectronics (France) )

Kwakman, L. F. Tz. ( Philips Semiconductors (France) )

Pokrant, S. ( Philips Semiconductors (France) )

Verkleij, D. ( FEI Co. (Netherlands) )

Schampers, R. ( FEI Co. (Netherlands) )

Ithier, L. ( STMicroelectrpronics (France) )

Sicurani, E. ( CEA-LETI (France) )

さらに 6 件

掲載資料名:

Metrology, Inspection, and Process Control for Microlithography XX

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6152

発行年:

2006

パート:

1

開始ページ:

615217

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461957 [0819461954]

言語:

英語

請求記号:

P63600/6152

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016184
シリーズID:	PA00000029
会議名:	SPIE Advanced Lithography : Metrology, Inspection, and Process Control for Microlithography
回次:	2006 : 20th
会議開催地:	San Jose, CA, USA
会議開催年:	2006.02.20-2006.02.23

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