Achieving mask-based imaging with optical maskless lithography [6151-87]
- 著者名:
Stone, E. M. ( ASML (USA) ) Hintersteiner, J. D. ( ASML (USA) ) Cebuhar, W. A. ( ASML (USA) ) Albright, R. ( ASML (USA) ) Eib, N. K. ( LSI Logic Corp. (USA) ) Latypov, A. ( ASML (USA) ) Baba-Ali, N. ( ASML (USA) ) Poultney, S. K. ( ASML (USA) ) Croffie, E. H. ( LSI Logic Corp. (USA) ) - 掲載資料名:
- Emerging Lithographic Technologies X
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6151
- 発行年:
- 2006
- パート:
- 2
- 開始ページ:
- 61512E
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461940 [0819461946]
- 言語:
- 英語
- 請求記号:
- P63600/6151
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Application of rigorous electromagnetic simulation to SLM-based maskless lithography for 65-nm node
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
4
国際会議録
OML: optical maskless lithography for economic design prototyping and small-volume production
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |