A TCAD-based yield and reliability analysis for VCSEls [6132-06]

A TCAD-based yield and reliability analysis for VCSEls [6132-06]

著者名:

Odermatt, S. ( ETH Zurich (Switzerland) )
Eitel, S. ( Avalon Photonics Ltd. (Switzerland) )
Hovel, R. ( Avalon Photonics Ltd. (Switzerland) )
Letay, G. ( Synopsys Switzerland LLC (Switzerland) )
Witzigmann, B. ( ETH Zurich (Switzerland) )

掲載資料名:

Vertical-Cavity Surface-Emitting Lasers X

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6132

発行年:

2006

開始ページ:

613206

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461742 [0819461741]

言語:

英語

請求記号:

P63600/6132

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016166
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Vertical-Cavity Surface-Emitting Lasers
回次:	2006 : 10th
会議開催地:	San Jose, CA, USA
会議開催年:	2006.01.25-2006.01.26

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