A TCAD-based yield and reliability analysis for VCSEls [6132-06]
- 著者名:
- Odermatt, S. ( ETH Zurich (Switzerland) )
- Eitel, S. ( Avalon Photonics Ltd. (Switzerland) )
- Hovel, R. ( Avalon Photonics Ltd. (Switzerland) )
- Letay, G. ( Synopsys Switzerland LLC (Switzerland) )
- Witzigmann, B. ( ETH Zurich (Switzerland) )
- 掲載資料名:
- Vertical-Cavity Surface-Emitting Lasers X
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6132
- 発行年:
- 2006
- 開始ページ:
- 613206
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461742 [0819461741]
- 言語:
- 英語
- 請求記号:
- P63600/6132
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |