Refractive index measurement by using a photonic crystal fiber [6128-65]
- 著者名:
- Sun, J. ( Nanyang Technological Univ. (Singapore) )
- Chan, C. C. ( Nanyang Technological Univ. (Singapore) )
- Dong, X. Y. ( Nanyang Technological Univ. (Singapore) )
- 掲載資料名:
- Photonic crystal materials and devices IV : 23-26 January, 2006, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6128
- 発行年:
- 2006
- 開始ページ:
- 61281V
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461704 [0819461709]
- 言語:
- 英語
- 請求記号:
- P63600/6128
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
国際会議録
Refractive index measurement for planar photonic crystal using a microscopy-spectrometry method
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |