Aerial platform attitude measurement by artificial vision [6070-14]

Aerial platform attitude measurement by artificial vision [6070-14]

著者名:

Truchetet F ( Le2i, UMR, CNRS 5158, Univ. de Bourgogne (France) )
Aubreton O ( Le2i, UMR, CNRS 5158, Univ. de Bourgogne (France) )
Gorria P ( Le2i, UMR, CNRS 5158, Univ. de Bourgogne (France) )
Laligant O ( Le2i, UMR, CNRS 5158, Univ. de Bourgogne (France) )

掲載資料名:

Machine Vision Applications in Industrial Inspection XIV

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6070

発行年:

2006

開始ページ:

60700D

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461100 [0819461105]

言語:

英語

請求記号:

P63600/6070

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016104
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Machine Vision Applications in Industrial Inspection
回次:	2006 : 14th
会議開催地:	San Jose, CA, USA
会議開催年:	2006.01.16-2006.01.17

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