Quantum efficiency characterization of back-illuminated CCDs: Part II. Reflectivity measurements [6068-36]

Quantum efficiency characterization of back-illuminated CCDs: Part II. Reflectivity measurements [6068-36]

著者名:

Fabricius, M. H. ( Lawrence Berkeley National Lab. (USA) )
Bebek, C. J. ( Lawrence Berkeley National Lab. (USA) )
Groom, D. E. ( Lawrence Berkeley National Lab. (USA) )
Karcher, A. ( Lawrence Berkeley National Lab. (USA) )
Roe, N. A. ( Lawrence Berkeley National Lab. (USA) )

掲載資料名:

Sensors, Cameras, and Systems for Scientific/Industrial Applications VII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6068

発行年:

2006

開始ページ:

60680G

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461087 [0819461083]

言語:

英語

請求記号:

P63600/6068

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016102
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Sensors, Cameras, and Systems for Scientific/Industrial Applications
回次:	2006 : 7th
会議開催地:	San Jose, CA, USA
会議開催年:	2006.01.17-2006.01.19

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