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Cupping artifacts analysis and correction for a FPD-based cone-beam CT [6065-35]

著者名:
掲載資料名:
Computational imaging IV : 16-18 January, 2006, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6065
発行年:
2006
開始ページ:
60650Z
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461056 [0819461059]
言語:
英語
請求記号:
P63600/6065
資料種別:
国際会議録

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