New residual stress detector using angle resolved Barkhausen noise [6041-111]
- 著者名:
- Yamaguchi M.
- Imae K.
- Nittono O. ( Fukushima Univ. (Japan) )
- Takagi T. ( Tohoku Univ. (Japan) )
- Yamada K. ( Saitama Univ. (Japan) )
- 掲載資料名:
- ICMIT 2005: Information Systems and Signal Processing
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6041
- 発行年:
- 2005
- 開始ページ:
- 604133
- 終了ページ:
- 604133
- 総ページ数:
- 1
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819460738 [0819460737]
- 言語:
- 英語
- 請求記号:
- P63600/6041
- 資料種別:
- 国際会議録
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