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New residual stress detector using angle resolved Barkhausen noise [6041-111]

著者名:
掲載資料名:
ICMIT 2005: Information Systems and Signal Processing
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6041
発行年:
2005
開始ページ:
604133
終了ページ:
604133
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460738 [0819460737]
言語:
英語
請求記号:
P63600/6041
資料種別:
国際会議録

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