Line-contact mching of conic surface of revolution and error analysis [6034-69]

Line-contact mching of conic surface of revolution and error analysis [6034-69]

著者名:

Jiao C.
Li Y.
Dai Y.
Agustin F-G ( National Univ. of Defense Technology (China) )

掲載資料名:

ICO20: optical design and fabrication : 21-26 August 2005, Changchun, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6034

発行年:

2006

開始ページ:

60341X

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460653 [0819460656]

言語:

英語

請求記号:

P63600/6034

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016069
シリーズID:	PA00000029
会議名:	ICO
回次:	2005 : 20th
会議開催地:	Changchun, China
会議開催年:	2005.08.21-2005.08.26

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