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Researching irirs serial images quality assessment method based on HVS [6034-65]

著者名:
掲載資料名:
ICO20: optical design and fabrication : 21-26 August 2005, Changchun, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6034
発行年:
2006
開始ページ:
60341T
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460653 [0819460656]
言語:
英語
請求記号:
P63600/6034
資料種別:
国際会議録

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