Blank Cover Image

Measurement of the birefrigence distribution in high resolution laser scanning lenses [6024-39]

著者名:
掲載資料名:
ICO20 : optical devices and instruments : 21-26 August, 2005, Changchun, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6024
発行年:
2005
開始ページ:
602413
終了ページ:
602413
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460554 [0819460559]
言語:
英語
請求記号:
P63600/6024
資料種別:
国際会議録

類似資料:

1 国際会議録 Analysis of various correction factors for MTF measurement with a square object [6024-32]

Hong S. M., Jo J. H., Cho H. S., Lee H. Y., Yang H. S., Lee Y. W., Lee I. W.

SPIE - The International Society of Optical Engineering
7 国際会議録 Optical design of the multi-spectral camera (MSC) for high-resolution Earth observation [6024-04]

Jang H.-S., Jung D.-J., Lee S.

SPIE - The International Society of Optical Engineering
2 国際会議録 Increase of dynamic range of a Shack-Hartmann sensor by shifting detector plane

Lee, W.-W., Lee, J. H., Hwangbo, C. K.

SPIE - The International Society of Optical Engineering
8 国際会議録 Haze acceleration system for photo mask application by using high repetition ArF excimer laser

D. -J. Kim, H. -J. Kim, S. -H. Eom, K. -J. Lee, W. -K. Cho

Society of Photo-optical Instrumentation Engineers
3 国際会議録 Effects of Post-Annealing on the Electrical and Optical Properties of ZnO Thin Films Grown on Al2O3 Substrates by Atomic Layer Epitaxy

C.M. Lee, Y.J. Cho, H.J. Kim, W.W. Lee, H.W. Kim, C.K. Hwangbo, J.G. Lee

Trans Tech Publications
9 国際会議録 Electrostatic 1D microscanner with vertical combs for HD resolution display

J.-W. Cho, Y.-H. Park, Y.-C. Ko, B.-L. Lee, S.-J. Kang, S.-W. Chung, W.-K. Choi, Y.-C. Cho, S.-M. Chang, J.-H. Lee, J. …

SPIE - The International Society of Optical Engineering
4 国際会議録 Optical performance analysis of F-Theta lens for laser scanning unit

D.-K. Lee, J.-H. Ahn, S.-S. Kim, H.-J. Kim, J.-H. Kim

Society of Photo-optical Instrumentation Engineers
10 国際会議録 Multilayer Laue lenses as high-resolution x-ray optics (Invited Paper)

Maser, J., Stephenson, G.B., Vogt, S., Yun, W., Macrander, A., Kang, H.C., Liu, C., Conley, R.

SPIE - The International Society of Optical Engineering
5 国際会議録 Eye-type scanning mirror with dual vertical combs for laser display

Ko, Y.-C., Cho, J.-W., Mun, Y.-K., Jeong, H.-G., Choi, W.-K., Lee, J.-H., Kim, J.-W., Yoo, J.-B.

SPIE - The International Society of Optical Engineering
11 国際会議録 Patterning with spacer for expanding the resolution limit of current lithography tool [6156-27]

Jung. W.-Y., Kim, C.-D., Eom, J-.D., Cho, S.-Y., Jeon, S.-M., Kim, J.-H., Moon, J.-I., Lee, B.-S., Park, S.-K.

SPIE - The International Society of Optical Engineering
6 国際会議録 Automatic measurement of gauge blocks by Fourier transforming the scanned interferograms [5879-05]

Kang, C.-S, Kim, J. W., Suh, H. S., Lee, W.-K

SPIE - The International Society of Optical Engineering
12 国際会議録 Near-field scanning optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides

Taylor,R.S., Leopold,K.E., Fraser,J.W., Feng,Y., Buchanan,M.

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12