Experimental demonstration of using nano-photonic crystal sensor systems for submicron damage detection, quantification, and diagnoses [6179-04]
- 著者名:
Verley, J. C. ( Sandia National Labs. (USA) ) Mani, S. S. ( Sandia National Labs. (USA) ) Fleming, J. G. ( Sandia National Labs. (USA) ) El-Kady, I. ( Sandia National Labs. (USA) ) Khraishi, T. ( Univ. of New Mexico (USA) ) Reda Taha M M ( Univ. of New Mexico (USA) ) - 掲載資料名:
- Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6179
- 発行年:
- 2006
- 開始ページ:
- 617904
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819462329 [0819462322]
- 言語:
- 英語
- 請求記号:
- P63600/6179
- 資料種別:
- 国際会議録
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