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Failure analysis of PC MCT caused by current [5964-46]

著者名:
Liu, D.
Wu, L. ( Shanghai Institute of Technical Physics, CAS (China) and Graduate School of the Chinese Academy of Sciences (China) )
Yuan, Y.
Zhang, L.
Jin, X.
Gong, H. ( Shanghai Institute of Technical Physics, CAS (China) )
さらに 1 件
掲載資料名:
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5964
発行年:
2005
開始ページ:
596415
終了ページ:
596415
総ページ数:
1
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459824 [0819459828]
言語:
英語
請求記号:
P63600/5964
資料種別:
国際会議録

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