High reflectivity measurement with cavity ring-down technique [5963-89]
- 著者名:
- 掲載資料名:
- Advances in optical thin films II : 13-15 September 2005, Jena, Germany
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5963
- 発行年:
- 2005
- 開始ページ:
- 59632F
- 出版情報:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819459817 [081945981X]
- 言語:
- 英語
- 請求記号:
- P63600/5963
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
国際会議録
Diode laser based continuous-wave cavity ring-down technique for high reflectivity measurement
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
5
国際会議録
Accurate high reflectivity measurement based on a novel optical feedback cavity ring-down technique
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |