Characterization of optical traps using on-line estimation methods [5930-73]

Characterization of optical traps using on-line estimation methods [5930-73]

著者名:

Gorman, J. J.
LeBurn, T. W.
Balijepalli, A.
Cagnon, C.
Lee, D. ( National Institute of Standards and Technology (USA) )

掲載資料名:

Optical Trapping and Optical Micromanipulation II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5930

発行年:

2005

開始ページ:

593023

終了ページ:

593023

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459350 [0819459356]

言語:

英語

請求記号:

P63600/5930

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015967
シリーズID:	PA00000029
会議名:	Optics & Photonics : Optical Trapping and Optical Micromanipulation
回次:	2005 : 2nd
会議開催地:	San Diego, CA, USA
会議開催年:	2005.07.31-2005.08.04

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